20136

,

Peter Seitz, Albert J.P. Theuwissen, editors

Springer,

xviii, 351 p. , ill. (some col.) , 24 cm.

Springer series in optical sciences,0342-4111 ;160

Fundamentals of noise in optoelectronics / Peter Seitz -- Image sensor technology / R. Daniel McGrath -- Hybrid avalanche photodiode array imaging / Hiroaki Aihara -- Electron bombarded semiconductor image sensors / Verle Aebi and Kenneth Costello -- Single -photon imaging using electron multiplication in vacuum / Gert Neutzel -- Electron-multiplying charge coupled devices : EMCCDs / Mark Stanford Robbins -- Monolithic single-photon avalanche diodes : SPADs / Edoardo Charbon and Matthew W. Fishburn -- Single photon CMOS imaging through noise minimizaion / Boyd Fowler -- Architectures for low-noise CMOS electronic imaging / Shoji Kawahito -- Low-noise electronic imaging with double-gate FETs and charge-modulation devices / Yoshiyuki Matsunaga -- Energy-sensitive single-photon-ray and particle imaging / Christian Lotto -- Single-photon detectors for time-of-flight range imaging / David Stoppa and Andrea Simoni -- Single-photon imaging for astronomy and aerospace applications / Pierre Magnan -- Exploiting molecular biology by time-resolved fluorescence imaging / Francis Meuller and Christof Fattinger.

AU Seitz, Peter,1956- , AU Theuwissen, Albert J. P.

TK

8315

.S56

2011

m

1391/10/04

9783642184420 (acid-free paper) ,

Includes bibliographical references and index.

c2011